{"created":"2023-06-20T15:28:30.615989+00:00","id":7641,"links":{},"metadata":{"_buckets":{"deposit":"5f9f1f01-0a8c-4cec-b49a-d456288e3b81"},"_deposit":{"created_by":12,"id":"7641","owners":[12],"pid":{"revision_id":0,"type":"depid","value":"7641"},"status":"published"},"_oai":{"id":"oai:ouj.repo.nii.ac.jp:00007641","sets":["389:471"]},"author_link":["9734","9733","9732","9735"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"653","bibliographicPageStart":"650","bibliographicVolumeNumber":"85","bibliographic_titles":[{"bibliographic_title":"IEICE transactions on electronics"},{"bibliographic_title":"IEICE transactions on electronics","bibliographic_titleLang":"en"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have fabricated a prototype of interface devices between SFQ and CMOS circuits using HTS quasi-particle injection devices. By the injection of quasi-particles, the bridge area becomes resistive and high voltage appears at the drain electrode. As a test of device operation, we applied the signal of a function generator to the gate electrode and observed that the device successfully repeated on/off operation. We also succeeded in explaining the device characteristics by considering the thermal effects.","subitem_description_type":"Abstract"}]},"item_10001_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"9734","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SHIGA, Hidehiro"}]},{"nameIdentifiers":[{"nameIdentifier":"9735","nameIdentifierScheme":"WEKO"}],"names":[{"name":"OKABE, Yoichi"}]}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人電子情報通信学会"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"IEICE Transactions Online TOP"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://search.ieice.org/","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"一般社団法人電子情報通信学会"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168524","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiga, Hidehiro"}],"nameIdentifiers":[{"nameIdentifier":"9732","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okabe, Yoichi"}],"nameIdentifiers":[{"nameIdentifier":"9733","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-10-04"}],"displaytype":"detail","filename":"2002volE85Cno3_650_653.pdf","filesize":[{"value":"2.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"2002volE85Cno3_650_653","url":"https://ouj.repo.nii.ac.jp/record/7641/files/2002volE85Cno3_650_653.pdf"},"version_id":"9a051fc6-eff4-45ae-999f-f7dacc990302"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"interface","subitem_subject_scheme":"Other"},{"subitem_subject":"quasi-particle","subitem_subject_scheme":"Other"},{"subitem_subject":"SFQ","subitem_subject_scheme":"Other"},{"subitem_subject":"CMOS","subitem_subject_scheme":"Other"},{"subitem_subject":"interface","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"quasi-particle","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"SFQ","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"CMOS","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits.","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits."},{"subitem_title":"HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits(<特集>Special Issue on Superconductive Electronics)","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"12","path":["471"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-10-04"},"publish_date":"2013-10-04","publish_status":"0","recid":"7641","relation_version_is_last":true,"title":["HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits."],"weko_creator_id":"12","weko_shared_id":-1},"updated":"2023-06-20T16:21:40.088272+00:00"}