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HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits.
https://ouj.repo.nii.ac.jp/records/7641
https://ouj.repo.nii.ac.jp/records/76413cb10009-1499-4117-82e3-99b9a15a4dd0
名前 / ファイル | ライセンス | アクション |
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2002volE85Cno3_650_653 (2.2 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2013-10-04 | |||||
タイトル | ||||||
タイトル | HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits. | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits(<特集>Special Issue on Superconductive Electronics) | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | interface | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | quasi-particle | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | SFQ | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | CMOS | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | interface | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | quasi-particle | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | SFQ | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | CMOS | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Shiga, Hidehiro
× Shiga, Hidehiro× Okabe, Yoichi |
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著者別名 | ||||||
識別子Scheme | WEKO | |||||
識別子 | 9734 | |||||
姓名 | SHIGA, Hidehiro | |||||
著者別名 | ||||||
識別子Scheme | WEKO | |||||
識別子 | 9735 | |||||
姓名 | OKABE, Yoichi | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We have fabricated a prototype of interface devices between SFQ and CMOS circuits using HTS quasi-particle injection devices. By the injection of quasi-particles, the bridge area becomes resistive and high voltage appears at the drain electrode. As a test of device operation, we applied the signal of a function generator to the gate electrode and observed that the device successfully repeated on/off operation. We also succeeded in explaining the device characteristics by considering the thermal effects. | |||||
書誌情報 |
IEICE transactions on electronics en : IEICE transactions on electronics 巻 85, 号 3, p. 650-653, 発行日 2002-03-01 |
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出版者 | ||||||
出版者 | 一般社団法人電子情報通信学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 09168524 | |||||
権利 | ||||||
権利情報 | 一般社団法人電子情報通信学会 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://search.ieice.org/ | |||||
関連名称 | IEICE Transactions Online TOP | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |